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Document Type: Article All Authors / Contributors: Lee S.Y.; Kim D.H.; Kim B.; Jung H.K.; Kim D.H. ISSN:0040-6090 Language Note: English Unique Identifier: 781719289 Awards:

Title : Comparative analysis of temperature thermally induced instability between Si-In-Zn-O and Ga-In-Zn-O thin film transistors
Author : Lee S.Y.; Kim D.H.; Kim B.; Jung H.K.; Kim D.H.
Language : en
Rating :
4.90 out of 5 stars
Type : PDF, ePub, Kindle
Uploaded : Apr 12, 2021

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